Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li 0001. The design-for-testability features of a general purpose microprocessor. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]
@inproceedings{WangFFLWLLHL07,
title = {The design-for-testability features of a general purpose microprocessor},
author = {Da Wang and Xiaoxin Fan and Xiang Fu and Hui Liu and Ke Wen and Rui Li and Huawei Li and Yu Hu and Xiaowei Li 0001},
year = {2007},
doi = {10.1109/TEST.2007.4437585},
url = {http://dx.doi.org/10.1109/TEST.2007.4437585},
researchr = {https://researchr.org/publication/WangFFLWLLHL07},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}