Automatic Test Pattern Generation for timing verification and delay testing of RSFQ circuits - researchr publication

researchr

You are not signed in
Sign in
Sign up

Fangzhou Wang, Sandeep K. Gupta. Automatic Test Pattern Generation for timing verification and delay testing of RSFQ circuits. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract is missing.

runs on WebDSL