2-gate-dielectric select gates in vertical-channel three-dimensional (3D) NAND flash memory

Bo Wang, Bin Gao, Huaqiang Wu, He Qian. 2-gate-dielectric select gates in vertical-channel three-dimensional (3D) NAND flash memory. Microelectronics Reliability, 78:80-84, 2017. [doi]

Abstract

Abstract is missing.