Horng-Bin Wang, Shi-Yu Huang, Jing-Reng Huang. Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 117-128, IEEE Computer Society, 2002. [doi]
Abstract is missing.