Retention-Aware DRAM Assembly and Repair for Future FGR Memories

Ying Wang, Yinhe Han, Cheng Wang, Huawei Li, Xiaowei Li 0001. Retention-Aware DRAM Assembly and Repair for Future FGR Memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(5):705-718, 2017. [doi]

Abstract

Abstract is missing.