A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits

J. F. Wang, T. Y. Kuo, J. Y. Lee. A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits. In DAC. pages 726-729, 1989. [doi]

Abstract

Abstract is missing.