Ying-chao Wang, Wei Liu, Peng Chen, Cong Zhang, Chun-Jing Li. FPGA Software Security Testing Excitation Random Generation Based on SFMEA and SFTA. In 6th International Conference on Dependable Systems and Their Applications, DSA 2019, Harbin, China, January 3-6, 2020. pages 465-469, IEEE, 2019. [doi]
Abstract is missing.