Test for more than pass/fail using on-chip temperature sensor

Chih-Wea Wang, Chen-Tung Lin, Chun-Chieh Hsu, Ching-Tung Wu, Chi-Feng Wu. Test for more than pass/fail using on-chip temperature sensor. In Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. pages 1-4, IEEE, 2012. [doi]

Abstract

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