The total ionizing dose response of leading-edge FDSOI MOSFETs

Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui. The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectronics Reliability, 88:979-983, 2018. [doi]

Authors

Jian Wang

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Binhong Li

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Yang Huang

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Kai Zhao

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Fang Yu

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Qiwen Zheng

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Qi Guo

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Liewei Xu

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J. Gao

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X. Cai

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Y. Cui

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