Simultaneous Fine-grain Sleep Transistor Placement and Sizing for Leakage Optimization

Yu Wang, Hai Lin, Huazhong Yang, Rong Luo, Hui Wang. Simultaneous Fine-grain Sleep Transistor Placement and Sizing for Leakage Optimization. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 723-728, IEEE Computer Society, 2006. [doi]

Abstract

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