Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski. Diagnosis of Hold Time Defects. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 192-199, IEEE Computer Society, 2004. [doi]
Abstract is missing.