A multiple indicator approach for FDI of inter-turn fault in induction machines

Danwei Wang, Jeevanand Seshadrinath, Viet Hung Nguyen, Abhisek Ukil, Viswanathan Vaiyapuri, Sivakumar Nadarajan, M. Siva Rama Krishna. A multiple indicator approach for FDI of inter-turn fault in induction machines. In IEEE International Conference on Industrial Technology, ICIT 2016, Taipei, Taiwan, March 14-17, 2016. pages 128-133, IEEE, 2016. [doi]

Abstract

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