SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology

Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu. SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. Microelectronics Reliability, 72:39-44, 2017. [doi]

Abstract

Abstract is missing.