Scalable behavior modeling for 3D field-programmable ESD protection structures

L. Wang, X. Wang, Z. T. Shi, R. Ma, C. Zhang, Z. Dong, F. Lu, H. Zhao, A. Wang. Scalable behavior modeling for 3D field-programmable ESD protection structures. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.