A low cost test data compression technique for high n-detection fault coverage

Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar. A low cost test data compression technique for high n-detection fault coverage. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]

Abstract

Abstract is missing.