Reliability analysis for accelerated degradation data based on the Wiener process with random effects

Xiaofei Wang, Bing Xing Wang, Wenhui Wu, Yili Hong 0001. Reliability analysis for accelerated degradation data based on the Wiener process with random effects. Quality and Reliability Eng. Int., 36(6):1969-1981, 2020. [doi]

Abstract

Abstract is missing.