Wei Wang, Tao Xie, Deng Zhou. Understanding the impact of threshold voltage on MLC flash memory performance and reliability. In Arndt Bode, Michael Gerndt, Per Stenström, Lawrence Rauchwerger, Barton P. Miller, Martin Schulz, editors, 2014 International Conference on Supercomputing, ICS'14, Muenchen, Germany, June 10-13, 2014. pages 201-210, ACM, 2014. [doi]
Abstract is missing.