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Functional Broadside Test Generation Using a Commercial ATPG Tool

Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz. Functional Broadside Test Generation Using a Commercial ATPG Tool. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 308-313, IEEE, 2017. [doi]

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