Zheng Wang, Hanbin Ying, Nujhat Tasneem, Anthony Gaskell, John D. Cressler, Martin Mourigal, Asif I. Khan. Cryogenic Characterization of Antiferroelectric Zirconia down to 50 mK. In Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019. pages 85-86, IEEE, 2019. [doi]
Abstract is missing.