Jue Wang, Hongyu Zhang. Predicting defect numbers based on defect state transition models. In Per Runeson, Martin Höst, Emilia Mendes, Anneliese Amschler Andrews, Rachel Harrison, editors, 2012 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM '12, Lund, Sweden - September 19 - 20, 2012. pages 191-200, ACM, 2012. [doi]
Abstract is missing.