Zan Wang, Yingquan Zhao, Shuang Liu, Jun Sun 0001, Xiang Chen 0005, Huarui Lin. MAP-Coverage: A Novel Coverage Criterion for Testing Thread-Safe Classes. In 34th IEEE/ACM International Conference on Automated Software Engineering, ASE 2019, San Diego, CA, USA, November 11-15, 2019. pages 722-734, IEEE, 2019. [doi]
Abstract is missing.