A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS

Chenkun Wang, Feilong Zhang, Fei Lu 0004, Qi Chen 0008, Cheng Li, Albert Z. Wang. A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS. IEEE Access, 8:87164-87172, 2020. [doi]

Abstract

Abstract is missing.