A Novel Pattern Rejection Criterion Based on Multiple Classifiers

Wei-Na Wang, Xu-Yao Zhang, Ching Y. Suen. A Novel Pattern Rejection Criterion Based on Multiple Classifiers. In Zhi-Hua Zhou, Fabio Roli, Josef Kittler, editors, Multiple Classifier Systems, 11th International Workshop, MCS 2013, Nanjing, China, May 15-17, 2013. Proceedings. Volume 7872 of Lecture Notes in Computer Science, pages 331-342, Springer, 2013. [doi]

Abstract

Abstract is missing.