J. Warmuth, Kay-Uwe Giering, André Lange, André Clausner, S. Schlipf, G. Kurz, M. Otto, J. Paul, Roland Jancke, A. Aal, Martin Gall, Ehrenfried Zschech. Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments. In 48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018. pages 178-181, IEEE, 2018. [doi]
Abstract is missing.