Virtual de-embedding study for the accurate extraction of Fin FET gate resistance - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Shireen Warnock, Rob Groves, Hongmei Li, Richard A. Wachnik, Pooja M. Kotecha, Sungjae Lee, Ning Lu, Paul Solomon, Keith Jenkins. Virtual de-embedding study for the accurate extraction of Fin FET gate resistance. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

This author has not been identified. Look up 'Shireen Warnock' in GoogleThis author has not been identified. Look up 'Rob Groves' in GoogleThis author has not been identified. Look up 'Hongmei Li' in GoogleThis author has not been identified. Look up 'Richard A. Wachnik' in GoogleThis author has not been identified. Look up 'Pooja M. Kotecha' in GoogleThis author has not been identified. Look up 'Sungjae Lee' in GoogleThis author has not been identified. Look up 'Ning Lu' in GoogleThis author has not been identified. Look up 'Paul Solomon' in GoogleThis author has not been identified. Look up 'Keith Jenkins' in Google

runs on WebDSL