Kimberly S. Wasson, Kendra N. Schmid, Robyn R. Lutz, John C. Knight. Using Occurrence Properties of Defect Report Data to Improve Requirements. In 13th IEEE International Conference on Requirements Engineering (RE 2005), 29 August - 2 September 2005, Paris, France. pages 253-262, IEEE Computer Society, 2005. [doi]
Abstract is missing.