Minoru Watanabe, Makoto Inami Kobayashi, Mitsutaka Isobe, Kunihiro Ogawa, Shigeo Matsuyama, Misako Miwa. Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array. In IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024. pages 1-2, IEEE, 2024. [doi]
Abstract is missing.