Minoru Watanabe, Makoto Kobayashi, Mitsutaka Isobe, Kunihiro Ogawa, Shingo Tamaki, Isao Murata, Sachie Kusaka. Fast-Neutron Soft-Error Tolerance of a Radiation-Hardened Repairable Field Programmable Gate Array. In IEEE International Conference on Consumer Electronics, ICCE 2025, Las Vegas, NV, USA, January 11-14, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.