Discriminative metric design for pattern recognition

Hideyuki Watanabe, Tsuyoshi Yamaguchi, Shigeru Katagiri. Discriminative metric design for pattern recognition. In 1995 International Conference on Acoustics, Speech, and Signal Processing, ICASSP '95, Detroit, Michigan, USA, May 08-12, 1995. pages 3439-3442, IEEE Computer Society, 1995. [doi]

Abstract

Abstract is missing.