ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs

I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle. ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 499-502, IEEE Computer Society, 1982.

Abstract

Abstract is missing.