The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths

Yuting Wei, Martin J. Wainwright. The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths. IEEE Transactions on Information Theory, 66(8):5110-5129, 2020. [doi]

Abstract

Abstract is missing.