Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer. Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 189-192, IEEE, 2012. [doi]
Abstract is missing.