Loic Welter, Philippe Dreux, Hassen Aziza, Jean Michel Portal. An innovative standard cells remapping method for in-circuit critical parameters monitoring. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014. pages 206-209, IEEE, 2014. [doi]
Abstract is missing.