A Novel ATPG Method for Capture Power Reduction during Scan Testing

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita. A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions, 90-D(9):1398-1405, 2007. [doi]

Abstract

Abstract is missing.