Research of Credit Grade Assessment for Suppliers Based on Multi-Layer SVM Classifier

Lei Wen, Junfei Li. Research of Credit Grade Assessment for Suppliers Based on Multi-Layer SVM Classifier. In Proceedings of the Sixth International Conference on Intelligent Systems Design and Applications (ISDA 2006), October 16-18, 2006, Jinan, China. pages 207-211, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.