X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja. A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 55-60, IEEE Computer Society, 2008. [doi]
Abstract is missing.