Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen. On A Software-Based Self-Test Methodology and Its Application. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 107-113, IEEE Computer Society, 2005. [doi]
Abstract is missing.