Wujie Wen, Yaojun Zhang, Yiran Chen, Yu Wang 0002, Yuan Xie. PS3-RAM: a fast portable and scalable statistical STT-RAM reliability analysis method. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 1191-1196, ACM, 2012. [doi]
Abstract is missing.