High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs

Matthias Wespel, M. Dammann, Vladimir Polyakov, Richard Reiner, Patrick Waltereit, B. Weiss, Rüdiger Quay, Michael Mikulla, Oliver Ambacher. High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]

Authors

Matthias Wespel

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M. Dammann

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Vladimir Polyakov

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Richard Reiner

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Patrick Waltereit

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B. Weiss

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Rüdiger Quay

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Michael Mikulla

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Oliver Ambacher

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