Chin-Long Wey, Adam Osseiran, José Luis Huertas, Yeon-Chen Nieu. Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 15, IEEE Computer Society, 2000. [doi]
Abstract is missing.