Kim Weyns, Per Runeson. Sensitivity of software system reliability to usage profile changes. In Yookun Cho, Roger L. Wainwright, Hisham Haddad, Sung Y. Shin, Yong Wan Koo, editors, Proceedings of the 2007 ACM Symposium on Applied Computing (SAC), Seoul, Korea, March 11-15, 2007. pages 1440-1444, ACM, 2007. [doi]
Abstract is missing.