Ratnadira Widyasari, Stefanus Agus Haryono, Ferdian Thung, Jieke Shi, Constance Tan, Fiona Wee, Jack Phan, David Lo 0001. On the Influence of Biases in Bug Localization: Evaluation and Benchmark. In IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2022, Honolulu, HI, USA, March 15-18, 2022. pages 128-139, IEEE, 2022. [doi]
Abstract is missing.