Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly. Iddq Testing for High Performance CMOS - The Next Ten Years. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 578-583, IEEE Computer Society, 1996. [doi]
Abstract is missing.