Thomas Charles Wilson, Anupam Basu, Dilip K. Banerji, Jayanti C. Majithia. Test plan generation and concurrent scheduling of tests in the presence of conflicts. In First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991. pages 243-248, IEEE, 1991. [doi]
Abstract is missing.