Matthias Wimmer, Christoph Mayer 0001, Freek Stulp, Bernd Radig. Face model fitting based on machine learning from multi-band images of facial components. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-6, IEEE, 2008. [doi]
Abstract is missing.