Chan-Yuan Wong, Hon-Ngen Fung. Post Catch-up Trajectories: Publishing and Patenting Activities of China and Korea. In Wolfgang Glänzel, Henk F. Moed, Ulrich Schmoch, Mike Thelwall, editors, Springer Handbook of Science and Technology Indicators. Springer Handbooks, pages 1037-1055, Springer, 2019. [doi]
Abstract is missing.