W. Eric Wong, Joseph Robert Horgan, Saul London, Aditya P. Mathur. Effect of Test Set Minimization on Fault Detection Effectiveness. In ICSE. pages 41-50, 1995. [doi]
@inproceedings{WongHLM95,
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
author = {W. Eric Wong and Joseph Robert Horgan and Saul London and Aditya P. Mathur},
year = {1995},
doi = {10.1145/225014.225018},
url = {http://doi.acm.org/10.1145/225014.225018},
tags = {testing},
researchr = {https://researchr.org/publication/WongHLM95},
cites = {0},
citedby = {0},
pages = {41-50},
booktitle = {ICSE},
}