Stitching defect detection and classification using wavelet transform and BP neural network

W. K. Wong, C. W. M. Yuen, D. D. Fan, L. K. Chan, E. H. K. Fung. Stitching defect detection and classification using wavelet transform and BP neural network. Expert Syst. Appl., 36(2):3845-3856, 2009. [doi]

Abstract

Abstract is missing.