Damon L. Woodard, Timothy C. Faltemier, Ping Yan, Patrick J. Flynn, Kevin W. Bowyer. A Comparison of 3D Biometric Modalities. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2006, New York, NY, USA, 17-22 June, 2006. pages 57, IEEE, 2006. [doi]
Abstract is missing.