Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure

N. Wrachien, D. Bari, J. Kovác, J. Jakabovic, D. Donoval, Gaudenzio Meneghesso, A. Cester. Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectronics Reliability, 52(9-10):2490-2494, 2012. [doi]

Abstract

Abstract is missing.